Main points to take away:
Fault models, Concepts of fault equivalence, fault collapsing and fault dominance.
Number of fault sites in a boolean gate circuit =#PI + #gates + #(fanout branches)
Primary inputs and fanout branches are checkpoints
Check point theorem: A test that detects all single(multiple) stuck-at faults on all checkpoints of a combinational circuit, also detects all [...]
Archive for February, 2008
Lec3
Posted in VLSI Verification on February 22, 2008 | Leave a Comment »
Lec 2, Slide 6 through 20.
Posted in VLSI Verification on February 22, 2008 | Leave a Comment »
Characterization test: Used to rank test vectors using score-boarding.
Scoreboarding is a centralized method, used in the CDC 6600, for dynamically scheduling a pipeline so that the instructions can execute out of order when there are no conflicts and the hardware is available.
NAC Diode (Net Area check diode): it is a diode, a PN-junction connected [...]
Lec 2, Slides 4 and 5
Posted in VLSI Verification on February 22, 2008 | Leave a Comment »
Verification testing includes circuit verification and power verification.
Circuit verification: Current, setup time, hold time, clock skew etc , memory check.
Power verification: Avg, max, drop(see inductance),
VRM: Voltage Regulator Module
A voltage regulator module (VRM) is an installable module that senses a computer’s microprocessor voltage requirements and ensures that the correct voltage is maintained. If you are changing [...]
Lec 2, Sl 3
Posted in VLSI Verification on February 22, 2008 | Leave a Comment »
The main point here to note is that verification is being done at 2 stages 1) during/end of design and after fab (where it is called design validation)
Logic Verification: Using software simulation/emulation
Design Validation: Verification using testers.
Lecture 2, Slide 2
Posted in VLSI Verification on February 22, 2008 | Leave a Comment »
Slide1:
Intro. This lecture covers test processes and equipment.
Slide2:
Automatic Test Pattern Generation(ATPG): EDA method used to determine an input test sequence that, when applied to a digital ckt., enables testers to distinguish between correct circuit behavior and faulty circuit behavior caused by defects.
Diagnostic Testing: Trying to determine as to why the wafer yield is low etc…testing [...]
Online Tutorials
Posted in Tutorials on February 20, 2008 | Leave a Comment »
Here are some excellent tutorials that I refer to:
UNIX Tutorials:
http://www.geekcomix.com/classnotes/
Unix power tools:
http://hell.org.ua/Docs/oreilly/unix/upt/index.htm
Perl Tutorial:
http://www.sthomas.net/roberts-perl-tutorial.htm
http://www.comp.leeds.ac.uk/Perl/
SQL Tutorial:
http://www.w3schools.com/sql/default.asp
Game Programming:
http://www.toymaker.info/Games/html/beginners.html
Operating Systems:
http://www.iu.hio.no/~mark/os/os.html